X-ray Microprobe REMMA 102 (SELMI, Ukraine)
Scanning electron microscope:
Accelerating voltage – up to 35 kV;
SEI mode resolution – 5 nm;
Magnification – from 10 to 250 000;
Energy dispersive X-ray spectrometer:
Analyzed element range – from Na;
Energy resolution - 143 eV at MnKα
Energy range – up to 30 kV;
Detection limit for Cu – about 0.01 %;
Wavelength dispersive X-ray spectrometer (2 pieces):
Analyzed element range – from B;
Crystals – LiF, PET,RAP, PbSt, MIR-030, MIR-040, MIR-060 and MIR-090.
Types of researches, which we provide:
Sample surface imaging in SEI, COMPO and TOPO modes;
X-ray electron probe spot microanalysis.