X-ray Microprobe REMMA 102 (SELMI, Ukraine)

SPECIFICATION:

Scanning electron microscope:

Accelerating voltage – up to 35 kV;

SEI mode resolution – 5 nm;

Magnification – from 10 to 250 000;

Energy dispersive X-ray spectrometer:

Analyzed element range – from Na;

Energy resolution - 143 eV at MnKα

Energy range – up to 30 kV;

Detection limit for Cu – about 0.01 %;

Wavelength dispersive X-ray spectrometer (2 pieces):

Analyzed element range – from B;

Crystals – LiF, PET,RAP, PbSt, MIR-030, MIR-040, MIR-060 and MIR-090.

Types of researches, which we provide:

Sample surface imaging in SEI, COMPO and TOPO modes;

X-ray electron probe spot microanalysis.

X-ray Microprobe REMMA 102 (SELMI, Ukraine)